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                  Example MDT-210 Configurations.

The MDT‑210L Low Magnification Microdisplay Tester (MDT) was developed for fast overall physical and functional testing of microdisplay devices in the R&D lab.  The MDT‑210L has the same software architecture as the MDT‑230 QA/QC and MDT‑250/270/290 Production Systems.  Thus, the tests developed on the MDT-210L can also be used on the other MDT-200 series units. This allows the tests developed in the lab to be directly correlated to the MDT‑200 Series test systems on the microdisplay production line.

 The MDT‑210L has been designed and constructed as an entry-level microdisplay test system as related to cost and throughput, yet has the full functionality of all the MDT‑200 Series testers.  The system offers a range of customization options, software utilities, and inherent accuracy that allows test definition for many different devices or subassemblies. The MDT‑210L makes an ideal solution for the testing needs of a microdisplay R&D lab.

 MDT-210L Test Capabilities   MDT-210H Test Capabilities
 
bulletAbsolute Brightness, both CCD and Spectrometer
bulletColor Spectrum Measurements
bulletContrast, both CCD and Spectrometer
bulletNewton Fringes
bulletTexture Analysis
bulletBlemishes (Scratches, Particles, and Bubbles)
bulletGray-scale Uniformity
bulletCross Talk
bulletFlicker and Response Time
bulletVT or EO Curve
bulletFunctional Testing of Device Subassembly
 
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Pixel Localization and Measurement

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Pixel Defect Detection and Clustering

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Sub-Pixel Defect Detection and Clustering

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Line and Column Defects

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Texture Analysis

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Uniformity

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Scratch and Blemish Detection

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Copyright © 2005 DCI Acquisition Corporation
Last modified: 06/24/05