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QA/QC Systems

PAS Characterization R&D Systems QA/QC Systems Pilot Production Automated Handling

        

                 
Example MDT-230 Configurations.

The MDT‑230L Low Magnification Microdisplay Tester (MDT) was developed for fast overall physical and functional testing of monochromatic, gray-scale, and color display devices for both production quality assurance and R&D applications.  The MDT‑230L has the same software architecture as the MDT‑210 Series R&D testers and the MDT‑250/270/290 Production Systems with direct correlation of tests performed on any of the MDT‑200 Series testers.  A sealed cabinet surrounds the MDT‑230L system to maintain a clean environment for testing.

 The MDT-230L Low Magnification tester has been designed and constructed to support QA/QC functions of a start-up micro-display production line or R&D efforts. The system offers a range of customization options, software utilities, and inherent accuracy that allows testing of many devices or subassemblies. These features make the MDT-230L well suited for either laboratory or audit level quality assurance of the Microdisplay production line.

 MDT-230L Test Capabilities   MDT-230H Test Capabilities
 
bulletAbsolute Brightness, both CCD and Spectrometer
bulletColor Spectrum Measurements
bulletContrast, both CCD and Spectrometer
bulletNewton Fringes
bulletTexture Analysis
bulletBlemishes (Scratches, Particles, and Bubbles)
bulletGray-scale Uniformity
bulletCross Talk
bulletFlicker and Response Time
bulletVT or EO Curve
bulletFunctional Testing of Device Subassembly
  
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Pixel Localization and Measurement

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Pixel Defect Detection and Clustering

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Sub-Pixel Defect Detection and Clustering

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Line and Column Defects

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Texture Analysis

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Uniformity

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Scratch and Blemish Detection

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Copyright © 2005 DCI Acquisition Corporation
Last modified: 06/24/05