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Example MDT-205 Configurations.
The MDT‑205L Low Magnification Microdisplay Tester (MDT)
was developed for fast overall physical characterization of microdisplay
devices in the projection industry QA/QC line. The MDT‑205L has the same software architecture as the
other MDT systems. Thus, the characterizations performed on the MDT-205L
can be directly correlated back to the MDT Production Systems on the microdisplay production line.
For more information, please download our informational
MDT-205L data sheet.
| MDT-205L
Test Capabilities |
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 | Throughput, both CCD and Spectrometer |
| Color Spectrum Measurements |
| Contrast, both CCD and Spectrometer |
| Newton Fringes |
| Blemishes (Scratches, Particles, and Bubbles) |
| Gray-scale Uniformity |
| Flicker and Response Time |
| EO Curve |
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