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This approach allows for fast and accurate macroscopic measurements of the entire microdisplay in a single image rather than multiple images and allows for a range of microscopic resolutions to best match defect characteristics. We have proven this approach on many microdisplay types (reflective, transmissive, and emissive) and are extending this to additional display technologies. We are also looking at new optics and processing solutions to improve the overall system capabilities. |
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